| 1 | smartctl 6.7 2018-06-21 r4735 [x86_64-w64-mingw32-w10-1803] (daily-20180621) |
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| 2 | Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org |
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| 3 | |
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| 4 | === START OF INFORMATION SECTION === |
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| 5 | Device Model: SAMSUNG MZMTD512HAGL-00000 |
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| 6 | Serial Number: S155NEAD303357 |
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| 7 | LU WWN Device Id: 5 002538 5502403dd |
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| 8 | Firmware Version: DXT4200Q |
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| 9 | User Capacity: 512,110,190,592 bytes [512 GB] |
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| 10 | Sector Size: 512 bytes logical/physical |
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| 11 | Rotation Rate: Solid State Device |
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| 12 | Device is: Not in smartctl database [for details use: -P showall] |
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| 13 | ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c |
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| 14 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) |
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| 15 | Local Time is: Sat Jul 14 18:23:24 2018 EDT |
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| 16 | SMART support is: Available - device has SMART capability. |
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| 17 | SMART support is: Enabled |
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| 18 | AAM feature is: Unavailable |
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| 19 | APM feature is: Unavailable |
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| 20 | Rd look-ahead is: Enabled |
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| 21 | Write cache is: Enabled |
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| 22 | DSN feature is: Unavailable |
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| 23 | ATA Security is: Disabled, frozen [SEC2] |
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| 24 | Wt Cache Reorder: Enabled |
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| 25 | |
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| 26 | === START OF READ SMART DATA SECTION === |
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| 27 | SMART overall-health self-assessment test result: PASSED |
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| 28 | |
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| 29 | General SMART Values: |
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| 30 | Offline data collection status: (0x00) Offline data collection activity |
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| 31 | was never started. |
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| 32 | Auto Offline Data Collection: Disabled. |
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| 33 | Self-test execution status: ( 0) The previous self-test routine completed |
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| 34 | without error or no self-test has ever |
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| 35 | been run. |
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| 36 | Total time to complete Offline |
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| 37 | data collection: (53956) seconds. |
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| 38 | Offline data collection |
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| 39 | capabilities: (0x53) SMART execute Offline immediate. |
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| 40 | Auto Offline data collection on/off support. |
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| 41 | Suspend Offline collection upon new |
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| 42 | command. |
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| 43 | No Offline surface scan supported. |
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| 44 | Self-test supported. |
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| 45 | No Conveyance Self-test supported. |
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| 46 | Selective Self-test supported. |
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| 47 | SMART capabilities: (0x0003) Saves SMART data before entering |
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| 48 | power-saving mode. |
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| 49 | Supports SMART auto save timer. |
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| 50 | Error logging capability: (0x01) Error logging supported. |
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| 51 | General Purpose Logging supported. |
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| 52 | Short self-test routine |
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| 53 | recommended polling time: ( 2) minutes. |
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| 54 | Extended self-test routine |
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| 55 | recommended polling time: ( 70) minutes. |
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| 56 | SCT capabilities: (0x003d) SCT Status supported. |
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| 57 | SCT Error Recovery Control supported. |
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| 58 | SCT Feature Control supported. |
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| 59 | SCT Data Table supported. |
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| 60 | |
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| 61 | SMART Attributes Data Structure revision number: 1 |
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| 62 | Vendor Specific SMART Attributes with Thresholds: |
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| 63 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE |
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| 64 | 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 |
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| 65 | 9 Power_On_Hours -O--CK 098 098 000 - 9633 |
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| 66 | 12 Power_Cycle_Count -O--CK 099 099 000 - 870 |
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| 67 | 177 Wear_Leveling_Count PO--C- 084 084 000 - 184 |
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| 68 | 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 |
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| 69 | 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 |
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| 70 | 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 |
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| 71 | 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 |
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| 72 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0 |
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| 73 | 190 Airflow_Temperature_Cel -O--CK 073 028 000 - 27 |
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| 74 | 195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0 |
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| 75 | 199 UDMA_CRC_Error_Count -OSRCK 099 099 000 - 26 |
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| 76 | 235 Unknown_Attribute -O--C- 099 099 000 - 105 |
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| 77 | 241 Total_LBAs_Written -O--CK 099 099 000 - 147476552099 |
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| 78 | ||||||_ K auto-keep |
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| 79 | |||||__ C event count |
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| 80 | ||||___ R error rate |
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| 81 | |||____ S speed/performance |
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| 82 | ||_____ O updated online |
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| 83 | |______ P prefailure warning |
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| 84 | |
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| 85 | General Purpose Log Directory Version 1 |
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| 86 | SMART Log Directory Version 1 [multi-sector log support] |
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| 87 | Address Access R/W Size Description |
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| 88 | 0x00 GPL,SL R/O 1 Log Directory |
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| 89 | 0x01 GPL,SL R/O 1 Summary SMART error log |
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| 90 | 0x02 GPL,SL R/O 1 Comprehensive SMART error log |
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| 91 | 0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log |
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| 92 | 0x06 GPL,SL R/O 1 SMART self-test log |
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| 93 | 0x07 GPL,SL R/O 1 Extended self-test log |
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| 94 | 0x09 GPL,SL R/W 1 Selective self-test log |
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| 95 | 0x10 GPL,SL R/O 1 NCQ Command Error log |
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| 96 | 0x11 GPL,SL R/O 1 SATA Phy Event Counters log |
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| 97 | 0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log |
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| 98 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log |
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| 99 | 0xa0 GPL,SL VS 16 Device vendor specific log |
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| 100 | |
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| 101 | SMART Extended Comprehensive Error Log Version: 1 (1 sectors) |
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| 102 | No Errors Logged |
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| 103 | |
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| 104 | Warning! SMART Extended Self-test Log Structure error: invalid SMART checksum. |
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| 105 | SMART Extended Self-test Log Version: 1 (1 sectors) |
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| 106 | |
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| 107 | SMART Selective self-test log data structure revision number 1 |
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| 108 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS |
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| 109 | 1 0 0 Not_testing |
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| 110 | 2 0 0 Not_testing |
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| 111 | 3 0 0 Not_testing |
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| 112 | 4 0 0 Not_testing |
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| 113 | 5 0 0 Not_testing |
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| 114 | 255 0 65535 Read_scanning was never started |
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| 115 | Selective self-test flags (0x0): |
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| 116 | After scanning selected spans, do NOT read-scan remainder of disk. |
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| 117 | If Selective self-test is pending on power-up, resume after 0 minute delay. |
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| 118 | |
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| 119 | SCT Status Version: 3 |
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| 120 | SCT Version (vendor specific): 256 (0x0100) |
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| 121 | Device State: SCT command executing in background (5) |
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| 122 | Current Temperature: 40 Celsius |
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| 123 | Power Cycle Min/Max Temperature: 40/40 Celsius |
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| 124 | Lifetime Min/Max Temperature: 0/70 Celsius |
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| 125 | Under/Over Temperature Limit Count: 0/0 |
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| 126 | |
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| 127 | SCT Temperature History Version: 3 (Unknown, should be 2) |
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| 128 | Temperature Sampling Period: 1 minute |
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| 129 | Temperature Logging Interval: 1 minute |
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| 130 | Min/Max recommended Temperature: 0/70 Celsius |
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| 131 | Min/Max Temperature Limit: 0/70 Celsius |
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| 132 | Temperature History Size (Index): 128 (0) |
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| 133 | |
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| 134 | Index Estimated Time Temperature Celsius |
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| 135 | 1 2018-07-14 16:16 ? - |
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| 136 | ... ..(125 skipped). .. - |
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| 137 | 127 2018-07-14 18:22 ? - |
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| 138 | 0 2018-07-14 18:23 40 ********************* |
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| 139 | |
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| 140 | SCT Error Recovery Control: |
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| 141 | Read: Disabled |
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| 142 | Write: Disabled |
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| 143 | |
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| 144 | Device Statistics (GP/SMART Log 0x04) not supported |
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| 145 | |
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| 146 | Pending Defects log (GP Log 0x0c) not supported |
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| 147 | |
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| 148 | SATA Phy Event Counters (GP Log 0x11) |
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| 149 | ID Size Value Description |
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| 150 | 0x0001 2 0 Command failed due to ICRC error |
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| 151 | 0x0002 2 0 R_ERR response for data FIS |
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| 152 | 0x0003 2 0 R_ERR response for device-to-host data FIS |
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| 153 | 0x0004 2 0 R_ERR response for host-to-device data FIS |
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| 154 | 0x0005 2 0 R_ERR response for non-data FIS |
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| 155 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS |
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| 156 | 0x0007 2 0 R_ERR response for host-to-device non-data FIS |
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| 157 | 0x0008 2 0 Device-to-host non-data FIS retries |
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| 158 | 0x0009 2 1 Transition from drive PhyRdy to drive PhyNRdy |
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| 159 | 0x000a 2 1 Device-to-host register FISes sent due to a COMRESET |
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| 160 | 0x000b 2 0 CRC errors within host-to-device FIS |
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| 161 | 0x000d 2 0 Non-CRC errors within host-to-device FIS |
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| 162 | 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC |
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| 163 | 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC |
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| 164 | 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC |
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| 165 | 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC |
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| 166 | |
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