| 1 | smartctl 6.6 2017-11-05 r4594 [x86_64-linux-3.10.0-693.21.1.el7.x86_64] (local build)
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| 2 | Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: KINGSTON SUV400S37240G
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| 6 | Serial Number: 50026B7682020E81
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| 7 | LU WWN Device Id: 5 0026b7 682020e81
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| 8 | Firmware Version: 0C3J96R9
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| 9 | User Capacity: 240,057,409,536 bytes [240 GB]
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| 10 | Sector Sizes: 512 bytes logical, 4096 bytes physical
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| 11 | Rotation Rate: Solid State Device
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| 12 | Form Factor: M.2
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| 13 | Device is: Not in smartctl database [for details use: -P showall]
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| 14 | ATA Version is: ACS-4, ATA8-ACS T13/1699-D revision 6
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| 15 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
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| 16 | Local Time is: Tue Apr 24 15:08:23 2018 MSK
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| 17 | SMART support is: Available - device has SMART capability.
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| 18 | SMART support is: Enabled
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| 19 | AAM feature is: Unavailable
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| 20 | APM feature is: Disabled
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| 21 | Rd look-ahead is: Enabled
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| 22 | Write cache is: Enabled
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| 23 | DSN feature is: Disabled
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| 24 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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| 25 | Wt Cache Reorder: Unknown
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| 26 |
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| 27 | === START OF READ SMART DATA SECTION ===
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| 28 | SMART overall-health self-assessment test result: PASSED
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| 29 |
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| 30 | General SMART Values:
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| 31 | Offline data collection status: (0x00) Offline data collection activity
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| 32 | was never started.
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| 33 | Auto Offline Data Collection: Disabled.
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| 34 | Self-test execution status: ( 0) The previous self-test routine completed
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| 35 | without error or no self-test has ever
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| 36 | been run.
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| 37 | Total time to complete Offline
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| 38 | data collection: ( 5) seconds.
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| 39 | Offline data collection
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| 40 | capabilities: (0x71) SMART execute Offline immediate.
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| 41 | No Auto Offline data collection support.
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| 42 | Suspend Offline collection upon new
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| 43 | command.
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| 44 | No Offline surface scan supported.
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| 45 | Self-test supported.
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| 46 | Conveyance Self-test supported.
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| 47 | Selective Self-test supported.
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| 48 | SMART capabilities: (0x0003) Saves SMART data before entering
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| 49 | power-saving mode.
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| 50 | Supports SMART auto save timer.
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| 51 | Error logging capability: (0x01) Error logging supported.
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| 52 | General Purpose Logging supported.
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| 53 | Short self-test routine
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| 54 | recommended polling time: ( 2) minutes.
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| 55 | Extended self-test routine
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| 56 | recommended polling time: ( 5) minutes.
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| 57 | Conveyance self-test routine
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| 58 | recommended polling time: ( 0) minutes.
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| 59 | SCT capabilities: (0x003d) SCT Status supported.
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| 60 | SCT Error Recovery Control supported.
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| 61 | SCT Feature Control supported.
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| 62 | SCT Data Table supported.
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| 63 |
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| 64 | SMART Attributes Data Structure revision number: 48
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| 65 | Vendor Specific SMART Attributes with Thresholds:
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| 66 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 67 | 1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0
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| 68 | 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
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| 69 | 9 Power_On_Hours -O--CK 100 100 000 - 0
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| 70 | 12 Power_Cycle_Count -O--CK 100 100 000 - 3
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| 71 | 100 Unknown_Attribute -O--CK 100 100 000 - 576
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| 72 | 101 Unknown_Attribute -O--CK 100 100 000 - 0
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| 73 | 170 Unknown_Attribute -O--CK 100 100 000 - 0
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| 74 | 171 Unknown_Attribute -O--CK 100 100 000 - 0
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| 75 | 172 Unknown_Attribute -O--CK 100 100 000 - 0
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| 76 | 174 Unknown_Attribute -O--CK 100 100 000 - 1
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| 77 | 175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
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| 78 | 176 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
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| 79 | 177 Wear_Leveling_Count -O--CK 100 100 000 - 0
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| 80 | 178 Used_Rsvd_Blk_Cnt_Chip -O---- 100 100 000 - 0
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| 81 | 180 Unused_Rsvd_Blk_Cnt_Tot -O---- 100 100 000 - 1363
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| 82 | 183 Runtime_Bad_Block -O--CK 100 100 000 - 0
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| 83 | 187 Reported_Uncorrect PO--CK 100 100 000 - 0
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| 84 | 194 Temperature_Celsius -O---K 031 100 000 - 31 (Min/Max 22/31)
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| 85 | 195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
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| 86 | 196 Reallocated_Event_Count -O--CK 100 100 000 - 0
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| 87 | 197 Current_Pending_Sector -O--CK 100 100 000 - 0
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| 88 | 199 UDMA_CRC_Error_Count -O--C- 100 100 000 - 0
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| 89 | 201 Unknown_SSD_Attribute -O--CK 100 100 000 - 0
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| 90 | 204 Soft_ECC_Correction -O--CK 100 100 000 - 0
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| 91 | 231 Temperature_Celsius -O--CK 100 100 000 - 0
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| 92 | 233 Media_Wearout_Indicator -O--CK 100 100 000 - 0
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| 93 | 234 Unknown_Attribute -O--CK 100 100 000 - 0
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| 94 | 241 Total_LBAs_Written -O--CK 100 100 000 - 0
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| 95 | 242 Total_LBAs_Read -O--CK 100 100 000 - 1
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| 96 | 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 0
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| 97 | ||||||_ K auto-keep
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| 98 | |||||__ C event count
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| 99 | ||||___ R error rate
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| 100 | |||____ S speed/performance
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| 101 | ||_____ O updated online
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| 102 | |______ P prefailure warning
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| 103 |
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| 104 | General Purpose Log Directory Version 1
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| 105 | SMART Log Directory Version 1 [multi-sector log support]
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| 106 | Address Access R/W Size Description
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| 107 | 0x00 GPL,SL R/O 1 Log Directory
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| 108 | 0x01 SL R/O 1 Summary SMART error log
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| 109 | 0x02 SL R/O 1 Comprehensive SMART error log
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| 110 | 0x03 GPL R/O 1 Ext. Comprehensive SMART error log
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| 111 | 0x04 GPL,SL R/O 8 Device Statistics log
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| 112 | 0x06 SL R/O 1 SMART self-test log
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| 113 | 0x07 GPL,SL R/O 1 Extended self-test log
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| 114 | 0x09 SL R/W 1 Selective self-test log
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| 115 | 0x0a GPL R/W 5 Device Statistics Notification
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| 116 | 0x10 GPL R/O 1 NCQ Command Error log
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| 117 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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| 118 | 0x30 GPL R/O 9 IDENTIFY DEVICE data log
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| 119 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 120 | 0xa1 SL VS 9 Device vendor specific log
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| 121 | 0xab SL VS 1 Device vendor specific log
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| 122 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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| 123 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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| 124 |
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| 125 | SMART Extended Comprehensive Error Log Version: 0 (1 sectors)
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| 126 | No Errors Logged
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| 127 |
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| 128 | SMART Extended Self-test Log Version: 0 (1 sectors)
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| 129 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 130 | # 1 Short offline Completed without error 00% 0 -
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| 131 |
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| 132 | SMART Selective self-test log data structure revision number 0
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| 133 | Note: revision number not 1 implies that no selective self-test has ever been run
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| 134 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 135 | 1 0 0 Not_testing
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| 136 | 2 0 0 Not_testing
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| 137 | 3 0 0 Not_testing
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| 138 | 4 0 0 Not_testing
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| 139 | 5 0 0 Not_testing
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| 140 | Selective self-test flags (0x0):
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| 141 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 142 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 143 |
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| 144 | SCT Status Version: 3
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| 145 | SCT Version (vendor specific): 1 (0x0001)
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| 146 | SCT Support Level: 0
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| 147 | Device State: Active (0)
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| 148 | Current Temperature: 31 Celsius
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| 149 | Power Cycle Min/Max Temperature: 28/31 Celsius
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| 150 | Lifetime Min/Max Temperature: 22/31 Celsius
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| 151 | Under/Over Temperature Limit Count: 0/0
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| 152 | SMART Status: 0xc24f (PASSED)
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| 153 |
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| 154 | SCT Temperature History Version: 2
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| 155 | Temperature Sampling Period: 1 minute
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| 156 | Temperature Logging Interval: 1 minute
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| 157 | Min/Max recommended Temperature: 0/70 Celsius
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| 158 | Min/Max Temperature Limit: 0/85 Celsius
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| 159 | Temperature History Size (Index): 478 (11)
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| 160 |
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| 161 | Index Estimated Time Temperature Celsius
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| 162 | 12 2018-04-24 07:11 ? -
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| 163 | ... ..(464 skipped). .. -
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| 164 | 477 2018-04-24 14:56 ? -
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| 165 | 0 2018-04-24 14:57 22 ***
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| 166 | 1 2018-04-24 14:58 ? -
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| 167 | 2 2018-04-24 14:59 28 *********
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| 168 | 3 2018-04-24 15:00 29 **********
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| 169 | 4 2018-04-24 15:01 30 ***********
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| 170 | 5 2018-04-24 15:02 30 ***********
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| 171 | 6 2018-04-24 15:03 30 ***********
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| 172 | 7 2018-04-24 15:04 31 ************
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| 173 | ... ..( 3 skipped). .. ************
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| 174 | 11 2018-04-24 15:08 31 ************
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| 175 |
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| 176 | SCT Error Recovery Control:
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| 177 | Read: Disabled
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| 178 | Write: Disabled
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| 179 |
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| 180 | Device Statistics (GP Log 0x04)
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| 181 | Page Offset Size Value Flags Description
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| 182 | 0x01 ===== = = === == General Statistics (rev 1) ==
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| 183 | 0x01 0x008 4 3 --- Lifetime Power-On Resets
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| 184 | 0x01 0x010 4 0 --- Power-on Hours
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| 185 | 0x01 0x018 6 0 --- Logical Sectors Written
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| 186 | 0x01 0x020 6 0 --- Number of Write Commands
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| 187 | 0x01 0x028 6 2772200 --- Logical Sectors Read
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| 188 | 0x01 0x030 6 10920 --- Number of Read Commands
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| 189 | 0x01 0x038 6 679600 --- Date and Time TimeStamp
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| 190 | 0x02 ===== = = === == Free-Fall Statistics (empty) ==
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| 191 | 0x03 ===== = = === == Rotating Media Statistics (empty) ==
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| 192 | 0x04 ===== = = === == General Errors Statistics (rev 1) ==
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| 193 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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| 194 | 0x04 0x010 4 1 --- Resets Between Cmd Acceptance and Completion
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| 195 | 0x05 ===== = = === == Temperature Statistics (rev 1) ==
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| 196 | 0x05 0x008 1 31 -D- Current Temperature
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| 197 | 0x05 0x010 1 - -D- Average Short Term Temperature
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| 198 | 0x05 0x018 1 0 -D- Average Long Term Temperature
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| 199 | 0x05 0x020 1 31 --- Highest Temperature
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| 200 | 0x05 0x028 1 22 --- Lowest Temperature
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| 201 | 0x05 0x030 1 - -D- Highest Average Short Term Temperature
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| 202 | 0x05 0x038 1 - -D- Lowest Average Short Term Temperature
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| 203 | 0x05 0x040 1 - -D- Highest Average Long Term Temperature
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| 204 | 0x05 0x048 1 - -D- Lowest Average Long Term Temperature
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| 205 | 0x05 0x050 4 0 -D- Time in Over-Temperature
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| 206 | 0x05 0x058 1 70 --- Specified Maximum Operating Temperature
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| 207 | 0x05 0x060 4 0 -D- Time in Under-Temperature
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| 208 | 0x05 0x068 1 0 --- Specified Minimum Operating Temperature
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| 209 | 0x06 ===== = = === == Transport Statistics (rev 1) ==
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| 210 | 0x06 0x008 4 1 --- Number of Hardware Resets
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| 211 | 0x06 0x018 4 0 --- Number of Interface CRC Errors
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| 212 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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| 213 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator
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| 214 | |||_ C monitored condition met
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| 215 | ||__ D supports DSN
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| 216 | |___ N normalized value
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| 217 |
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| 218 | Pending Defects log (GP Log 0x0c) not supported
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| 219 |
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| 220 | SATA Phy Event Counters (GP Log 0x11)
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| 221 | ID Size Value Description
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| 222 | 0x0001 4 0 Command failed due to ICRC error
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| 223 | 0x000a 4 1 Device-to-host register FISes sent due to a COMRESET
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| 224 |
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