1 | smartctl 6.2 2017-02-27 r4394 [x86_64-linux-3.10.0-514.6.1.el7.x86_64] (local build)
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2 | Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
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3 |
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4 | === START OF INFORMATION SECTION ===
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5 | Device Model: Micron_5200_MTFDDAK1T9TDC
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6 | Serial Number: 17501A67E9AE
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7 | LU WWN Device Id: 5 00a075 11a67e9ae
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8 | Firmware Version: D1MU003
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9 | User Capacity: 1 920 383 410 176 bytes [1,92 TB]
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10 | Sector Sizes: 512 bytes logical, 4096 bytes physical
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11 | Rotation Rate: Solid State Device
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12 | Device is: Not in smartctl database [for details use: -P showall]
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13 | ATA Version is: ACS-3 (unknown minor revision code: 0x006d)
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14 | SATA Version is: SATA >3.1, 6.0 Gb/s (current: 6.0 Gb/s)
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15 | Local Time is: Wed Apr 4 06:51:15 2018 MSK
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16 | SMART support is: Available - device has SMART capability.
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17 | SMART support is: Enabled
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18 | AAM feature is: Unavailable
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19 | APM level is: 254 (maximum performance)
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20 | Rd look-ahead is: Enabled
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21 | Write cache is: Enabled
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22 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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23 | Wt Cache Reorder: Enabled
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24 |
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25 | === START OF READ SMART DATA SECTION ===
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26 | SMART overall-health self-assessment test result: PASSED
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27 |
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28 | General SMART Values:
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29 | Offline data collection status: (0x00) Offline data collection activity
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30 | was never started.
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31 | Auto Offline Data Collection: Disabled.
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32 | Self-test execution status: ( 0) The previous self-test routine completed
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33 | without error or no self-test has ever
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34 | been run.
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35 | Total time to complete Offline
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36 | data collection: ( 3331) seconds.
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37 | Offline data collection
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38 | capabilities: (0x7b) SMART execute Offline immediate.
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39 | Auto Offline data collection on/off support.
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40 | Suspend Offline collection upon new
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41 | command.
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42 | Offline surface scan supported.
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43 | Self-test supported.
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44 | Conveyance Self-test supported.
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45 | Selective Self-test supported.
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46 | SMART capabilities: (0x0003) Saves SMART data before entering
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47 | power-saving mode.
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48 | Supports SMART auto save timer.
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49 | Error logging capability: (0x01) Error logging supported.
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50 | General Purpose Logging supported.
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51 | Short self-test routine
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52 | recommended polling time: ( 2) minutes.
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53 | Extended self-test routine
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54 | recommended polling time: ( 14) minutes.
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55 | Conveyance self-test routine
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56 | recommended polling time: ( 3) minutes.
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57 | SCT capabilities: (0x0035) SCT Status supported.
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58 | SCT Feature Control supported.
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59 | SCT Data Table supported.
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60 |
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61 | SMART Attributes Data Structure revision number: 16
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62 | Vendor Specific SMART Attributes with Thresholds:
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63 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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64 | 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
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65 | 5 Reallocated_Sector_Ct -O--CK 100 100 001 - 0
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66 | 9 Power_On_Hours -O--CK 100 100 000 - 177
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67 | 12 Power_Cycle_Count -O--CK 100 100 001 - 1
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68 | 170 Unknown_Attribute PO--CK 100 100 010 - 0
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69 | 171 Unknown_Attribute -O--CK 100 100 000 - 0
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70 | 172 Unknown_Attribute -O--CK 100 100 001 - 0
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71 | 173 Unknown_Attribute -O--CK 100 100 000 - 3
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72 | 174 Unknown_Attribute -O--CK 100 100 000 - 0
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73 | 183 Runtime_Bad_Block -O--CK 100 100 000 - 0
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74 | 184 End-to-End_Error -O--CK 100 100 000 - 0
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75 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0
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76 | 188 Command_Timeout -O--CK 100 100 000 - 0
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77 | 194 Temperature_Celsius -O---K 074 071 000 - 26 (Min/Max 19/29)
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78 | 195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
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79 | 196 Reallocated_Event_Count -O--CK 100 100 000 - 0
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80 | 197 Current_Pending_Sector -O--CK 100 100 000 - 0
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81 | 198 Offline_Uncorrectable ----CK 100 100 000 - 0
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82 | 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
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83 | 202 Unknown_SSD_Attribute ----CK 100 100 001 - 0
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84 | 206 Unknown_SSD_Attribute -OSR-- 100 100 000 - 0
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85 | 246 Unknown_Attribute -O--CK 100 100 000 - 10332552282
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86 | 247 Unknown_Attribute -O--CK 100 100 000 - 323353157
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87 | 248 Unknown_Attribute -O--CK 100 100 000 - 210327612
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88 | 180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 000 000 000 - 6718
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89 | 210 Unknown_Attribute -O--CK 100 100 000 - 0
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90 | ||||||_ K auto-keep
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91 | |||||__ C event count
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92 | ||||___ R error rate
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93 | |||____ S speed/performance
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94 | ||_____ O updated online
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95 | |______ P prefailure warning
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96 |
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97 | General Purpose Log Directory Version 1
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98 | SMART Log Directory Version 1 [multi-sector log support]
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99 | Address Access R/W Size Description
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100 | 0x00 GPL,SL R/O 1 Log Directory
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101 | 0x01 SL R/O 1 Summary SMART error log
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102 | 0x02 SL R/O 51 Comprehensive SMART error log
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103 | 0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
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104 | 0x04 GPL,SL R/O 8 Device Statistics log
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105 | 0x06 SL R/O 1 SMART self-test log
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106 | 0x07 GPL R/O 1 Extended self-test log
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107 | 0x09 SL R/W 1 Selective self-test log
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108 | 0x10 GPL R/O 1 NCQ Command Error log
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109 | 0x11 GPL R/O 1 SATA Phy Event Counters
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110 | 0x13 GPL R/O 1 SATA NCQ Send and Receive log
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111 | 0x24 GPL R/O 8000 Current Device Internal Status Data log
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112 | 0x25 GPL R/O 8000 Saved Device Internal Status Data log
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113 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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114 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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115 | 0xa0 GPL VS 35328 Device vendor specific log
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116 | 0xa1 GPL,SL VS 4 Device vendor specific log
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117 | 0xa3 GPL VS 13824 Device vendor specific log
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118 | 0xa4 GPL VS 354 Device vendor specific log
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119 | 0xa4 SL VS 98 Device vendor specific log
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120 | 0xa5 GPL VS 8000 Device vendor specific log
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121 | 0xa5 SL VS 64 Device vendor specific log
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122 | 0xa6 GPL VS 8000 Device vendor specific log
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123 | 0xa6 SL VS 64 Device vendor specific log
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124 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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125 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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126 |
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127 | SMART Extended Comprehensive Error Log size 16383 not supported
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128 |
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129 | SMART Error Log Version: 1
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130 | No Errors Logged
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131 |
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132 | SMART Extended Self-test Log Version: 1 (1 sectors)
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133 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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134 | # 1 Short offline Completed without error 00% 147 -
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135 |
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136 | SMART Selective self-test log data structure revision number 1
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137 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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138 | 1 0 0 Not_testing
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139 | 2 0 0 Not_testing
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140 | 3 0 0 Completed [00% left] (37752960-37818495)
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141 | 4 0 0 Not_testing
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142 | 5 0 0 Not_testing
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143 | Selective self-test flags (0x0):
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144 | After scanning selected spans, do NOT read-scan remainder of disk.
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145 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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146 |
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147 | SCT Status Version: 3
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148 | SCT Version (vendor specific): 1 (0x0001)
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149 | SCT Support Level: 0
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150 | Device State: Active (0)
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151 | Current Temperature: 26 Celsius
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152 | Power Cycle Min/Max Temperature: 19/29 Celsius
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153 | Lifetime Min/Max Temperature: 19/29 Celsius
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154 | Under/Over Temperature Limit Count: 0/0
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155 | SCT Temperature History Version: 2
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156 | Temperature Sampling Period: 1 minute
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157 | Temperature Logging Interval: 1 minute
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158 | Min/Max recommended Temperature: 0/70 Celsius
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159 | Min/Max Temperature Limit: -5/75 Celsius
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160 | Temperature History Size (Index): 478 (19)
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161 |
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162 | Index Estimated Time Temperature Celsius
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163 | 20 2018-04-03 22:54 ? -
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164 | ... ..(459 skipped). .. -
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165 | 2 2018-04-04 06:34 ? -
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166 | 3 2018-04-04 06:35 22 ***
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167 | 4 2018-04-04 06:36 23 ****
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168 | 5 2018-04-04 06:37 24 *****
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169 | 6 2018-04-04 06:38 24 *****
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170 | 7 2018-04-04 06:39 24 *****
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171 | 8 2018-04-04 06:40 27 ********
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172 | 9 2018-04-04 06:41 23 ****
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173 | 10 2018-04-04 06:42 24 *****
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174 | 11 2018-04-04 06:43 23 ****
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175 | 12 2018-04-04 06:44 23 ****
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176 | 13 2018-04-04 06:45 24 *****
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177 | ... ..( 4 skipped). .. *****
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178 | 18 2018-04-04 06:50 24 *****
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179 | 19 2018-04-04 06:51 26 *******
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180 |
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181 | SCT Error Recovery Control command not supported
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182 |
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183 | Device Statistics (GP Log 0x04)
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184 | Page Offset Size Value Description
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185 | 1 ===== = = == General Statistics (rev 1) ==
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186 | 1 0x008 4 1 Lifetime Power-On Resets
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187 | 1 0x010 4 177 Power-on Hours
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188 | 1 0x018 6 10332552450 Logical Sectors Written
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189 | 1 0x020 6 89403698 Number of Write Commands
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190 | 1 0x028 6 838048722 Logical Sectors Read
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191 | 1 0x030 6 3394844 Number of Read Commands
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192 | 1 0x038 6 639840000 Date and Time TimeStamp
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193 | 4 ===== = = == General Errors Statistics (rev 1) ==
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194 | 4 0x008 4 0 Number of Reported Uncorrectable Errors
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195 | 4 0x010 4 0 Resets Between Cmd Acceptance and Completion
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196 | 5 ===== = = == Temperature Statistics (rev 1) ==
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197 | 5 0x008 1 26 Current Temperature
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198 | 5 0x010 1 - Average Short Term Temperature
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199 | 5 0x018 1 - Average Long Term Temperature
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200 | 5 0x020 1 29 Highest Temperature
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201 | 5 0x028 1 19 Lowest Temperature
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202 | 5 0x030 1 - Highest Average Short Term Temperature
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203 | 5 0x038 1 - Lowest Average Short Term Temperature
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204 | 5 0x040 1 - Highest Average Long Term Temperature
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205 | 5 0x048 1 - Lowest Average Long Term Temperature
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206 | 5 0x050 4 0 Time in Over-Temperature
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207 | 5 0x058 1 70 Specified Maximum Operating Temperature
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208 | 5 0x060 4 0 Time in Under-Temperature
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209 | 5 0x068 1 0 Specified Minimum Operating Temperature
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210 | 6 ===== = = == Transport Statistics (rev 1) ==
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211 | 6 0x008 4 0 Number of Hardware Resets
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212 | 6 0x010 4 0 Number of ASR Events
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213 | 6 0x018 4 0 Number of Interface CRC Errors
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214 | 7 ===== = = == Solid State Device Statistics (rev 1) ==
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215 | 7 0x008 1 0~ Percentage Used Endurance Indicator
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216 | |_ ~ normalized value
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217 |
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218 | SATA Phy Event Counters (GP Log 0x11)
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219 | ID Size Value Description
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220 | 0x0001 4 0 Command failed due to ICRC error
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221 | 0x0003 4 0 R_ERR response for device-to-host data FIS
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222 | 0x0004 4 0 R_ERR response for host-to-device data FIS
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223 | 0x0006 4 0 R_ERR response for device-to-host non-data FIS
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224 | 0x000a 4 0 Device-to-host register FISes sent due to a COMRESET
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225 | 0x000b 4 0 CRC errors within host-to-device FIS
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226 | 0x000d 4 0 Non-CRC errors within host-to-device FIS
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